Phase-locked loops that share a loop filter

ABSTRACT

A die stack of an integrated circuit includes a plurality of dies. Each die in the die stack includes a phase lock loop (PLL). The PLLs in each of the dies share a loop filter and other corresponding circuits.

CROSS-REFERENCE TO RELATED APPLICATION

The present application claims priority of U.S. Provisional PatentApplication No. 61/565,271, filed on Nov. 30, 2011, which isincorporated herein by reference in its entirety.

FIELD OF DISCLOSURE

The present disclosure is related to phase-locked loops (PLLs) thatshare a loop filter.

BACKGROUND

With a progress in the technology of die manufacturing and packaging,three-dimensional integrated circuits (3DICs) have been developed inwhich two or more dies are integrated vertically and/or horizontally ina single die stack. Depending on the functional requirement, eachstacked die includes a PLL to generate an individual clock. Thefrequencies of the clocks in each of the stacked dies therefore vary.Further, existing PLLs generally occupy a large die area and thereforeincrease the total die area of each stacked die.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a block diagram illustrating clock generation for each die ina die stack in accordance with some embodiments.

FIG. 2A is a block diagram illustrating a clock generation means foreach die in a die stack in accordance with some embodiments.

FIG. 2B is a schematic view of a programmable connection element inaccordance with some embodiments.

FIG. 3 is a schematic diagram of the loop filter in accordance with someembodiments.

FIG. 4 is a schematic diagram of the loop filter in accordance with somefurther embodiments.

FIG. 5 is a block diagram illustrating another clock generation meansfor each die in a die stack in accordance with some embodiments.

FIG. 6 illustrates a waveform view of a selection signal on port E ofthe loop filter in accordance with some embodiments.

DETAILED DESCRIPTION

The making and using of the embodiments of the disclosure are discussedin detail below. It should be appreciated, however, that the embodimentsprovide many applicable inventive innovations that can be embodied in awide variety of specific contexts. The specific embodiments discussedare merely illustrative, and do not limit the scope of the disclosure.

This description of the exemplary embodiments is intended to be read inconnection with the accompanying drawings, which are to be consideredpart of the entire written description. In the description, relativeterms such as “lower,” “upper,” “horizontal,” “vertical,”, “above,”“below,” “up,” “down,” “top” and “bottom” as well as derivative thereof(e.g., “horizontally,” “downwardly,” “upwardly,” etc.) should beconstrued to refer to the orientation as then described or as shown inthe drawing under discussion. These relative terms are for convenienceof description and do not require that the apparatus be constructed oroperated in a particular orientation. Terms concerning attachments,coupling and the like, such as “connected” and “interconnected,” referto a relationship wherein structures are secured or attached to oneanother either directly or indirectly through intervening structures,unless expressly described otherwise.

Some embodiments have one or a combination of the following featuresand/or advantages. Each die in a die stack includes a PLL. The PLLs ineach die of the die stack share a loop filter. As a result, the size ofeach stacked die is smaller, resulting in additional functions beingprovided in a same die size area. In other words, the functionalcapacity per volume unit of each die is higher. By sharing the loopfilter, the clock phase of the clocks of the PLLs take turns to lockwith a reference clock.

FIG. 1 is a block diagram of a die stack 100 illustrating the clockgeneration for each die in a die stack, according to an exampleembodiment. The die stack 100 includes dies 110, 120 and an interposer130. In some embodiments, each of dies 110 and 120 is symmetricallyand/or asymmetrically stacked on the interposer 130, either on the sameside or on the different side of the interposer 130. In someembodiments, the dies 110 and 120 are heterogeneous dies. In some otherembodiments, the dies 110 and 120 are homogeneous dies. In someembodiments, the interposer 130 provides connections between the diestack 100 and external inputs/outputs (I/O)s. The interposer 130 isformed of materials such as semiconductor materials, dielectricmaterials, or the like. In various embodiments, the interposer 130 is aprinted circuit board (PCB), an integrated circuit carrier board, or anyother board. Although FIG. 1 only shows two dies 110 and 120 stacked onthe interposer 130, any number of dies is within the scope of variousembodiments.

A clock signal REF_CLK 135 on an electrical connection 133 may begenerated by circuitries located in the interposer 130 or in other diesmounted on the interposer 130, such as die 110, 120, etc. The clocksignal REF_CLK 135 is electrically connected to PLLs 115 and 125 of dies110 and 120, respectively. In some embodiments, the clock signal REF_CLK135 is a periodic clock signal generated from a reference clock source,such as a crystal oscillator. The PLL 115 and 125 output clocks 119 and129 through electrical connections 150 and 170, respectively. In someembodiments, clocks 119 and 129 are transmitted to and usable by othercircuit blocks of the dies 110 and 120, respectively. The electricalconnection referred in this document may be any form ofinterconnections, such as metal, vias, poly, quantum lines or dots (OD),redistribution layer (RDL), through substrate vias (TSVs), or anyconductor made of other materials.

With reference to FIG. 2A, die stack 100 is shown in detail, accordingto an example embodiment. The dies 110 and 120 include PLLs 115 and 125,respectively. In some embodiments, the PLL 115 is similar to the PLL125. The interposer 130 includes a loop filter LF 180 to be shared bythe PLLs 115 and 125.

The PLL 115 includes a phase and frequency detector (PFD) 142, a chargepump (CP) 144, a voltage controlled oscillator (VCO) 146, and a feedbackdivider (DIV) 148. The PFD 142 receives two inputs, a clock signalREF_CLK 135 and a local clock signal 152, which is a divided version ofan output clock of the VCO 146 through electrical connection 150. ThePFD 142 determines the relative phase difference between the REF_CLK 135and the local clock signal 152, and outputs a signal that isproportional to the phase difference and that is fed into the CP 144.The CP 144 converts the input signal into an analog voltage and feedsthis analog voltage to a port A of the LF 180 in the interposer 130through an electrical connection 154. In some embodiments, the LF 180 isa low-pass filter that removes the high frequency components in theanalog voltage outputted by the CP 144, and outputs a DC voltage. The DCvoltage is outputted from a port B of the LF 180 and fed to the VCO 146through the electrical connection 156. The VCO 146 increases ordecreases the frequency of the output clock on the electrical connection150 according to the corresponding increased or decreased DC voltage.The DIV 148 receives the output clock through electrical connection 150and provides the local clock signal 152 to PFD 142. The frequency of thelocal clock signal 152 is divided from the frequency of the output clockon electrical connection 150 by a predetermined ratio. As illustrativelyshown in FIG. 2A, elements of the PLL 115, combined with the LF 180,form a feedback loop. For example, PFD 142, CP 144, LF 180, VCO 146, andDIV 148 form the feedback loop.

Similarly, the PLL 125 includes a phase and frequency detector (PFD)162, a charge pump (CP) 164, a voltage controlled oscillator (VCO) 166,and a feedback divider (DIV) 168. The connectivity in the PLL 125 issimilar to that of the PLL 115, except that an analog voltage outputtedfrom the CP 164 is fed to a port C of the LF 180 through electricalconnection 174, and a DC voltage outputted from a port D of the LF 180is fed to the VCO 166 through electrical connection 176. As a result,elements of the PLL 125, together with the LF 180, form another feedbackloop. For example, PFD 162, CP 164, LF 180, VCO 166, and DIV 168 formthe second feedback loop. As illustratively shown in FIG. 2A, the PLLs115 and 125 share the common LF 180 in the interposer 130. In someembodiments, a circuit (not shown) generates a selection signal to aport E of the LF 180 to select the feedback loop that uses the common LF180 at a particular period of time. The circuit may be located in theinterposer 130 or in one of the dies stacked on the interposer 130, suchas a die 110, a die 120, etc.

In FIG. 2A, the LF 180 is placed in the interposer 130 for illustration.The LF 180, however, may be placed in the dies 110, 120, or another diestacked on the interposer 130.

FIG. 2B is a schematic of a programmable connection element 200according to an example embodiment. Programmable connection element 200is for use by the LFs 300 and 400 in the corresponding FIGS. 3 and 4, inaccordance with some embodiments. A transmission gate 24 is used toconnect electrical ports 22 and 28, with a switch control (not shown)from electrical port 26. The programmable connection element 200 isactivated to electrically connect the electrical port 22 to theelectrical port 28 when the electrical port 26 receives a logical highvoltage. In contrast, the programmable connection element 200 isdisabled to electrically disconnect the electrical port 22 from theelectrical port 28 when the electrical port 26 receives a logical lowvoltage. An inverter 25 inverts the signal on electrical port 26 andprovides a signal that controls the transmission gate 24.

FIG. 3 is a loop filter 300 illustrating an implementation of the LF 180in FIG. 2, according to an example embodiment. The loop filter 300comprises programmable connection elements 302, 304, 306 and 308;capacitors 322, 324 and 326; and resistors 332 and 334. The programmableconnection elements 302, 304, 306 and 308 are implemented using theprogrammable connection element 200 shown in FIG. 2B. For illustration,ports indicated by a circle for the programmable connection elements302, 304, 306 and 308 in FIG. 3 correspond to the electrical port 28shown in FIG. 2B. The ports positioned on the opposite side of theelectrical port 28 of programmable connection elements 302, 304, 306 and308 correspond to the electrical port 22 shown in FIG. 2B and theremaining port corresponds to the electrical port 26 shown in FIG. 2B.

The programmable connection element 302 controls a connection between aport A of the LF 300 and an electrical connection 372. The programmableconnection element 304 controls a connection between a port C of the LF300 and the electrical connection 372. The programmable connectionelement 306 controls a connection between electrical connection 374 anda port B of the LF 300. The programmable connection element 308 controlsa connection between the electrical connection 374 and a port D of theLF 300. Signals used to connect to the corresponding electrical port 26shown in FIG. 2B are generated from the selection signal on port E ofthe LF 300. For example, a signal E_B, which is connected to a port Ethrough inverter 352, is connected to the corresponding electrical port26 shown in FIG. 2B of programmable connection elements 302 and 306. Inaddition, a signal E_P, which is connected to a port E through inverter352 and 354, is connected to the corresponding electrical port 26 shownin FIG. 2B of programmable connection elements 304 and 308.

Capacitor 322 is connected between the electrical connection 372 and aground. Capacitor 324 and resistor 332 are serially connected betweenthe electrical connection 372 and the ground. Capacitor 326 is connectedbetween the electrical connection 374 and the ground. Resistor 334 isconnected between the electrical connection 372 and 374.

Inverter 352 inverts the signal on the port E to provide signal E_Bwhile inverter 354 inverts signal E_B to provide signal E_P. As aresult, when the port E is logically low, the signal E_B is logicallyhigh and the signal E_P is logically low. The programmable connectionelements 302 and 306 are therefore activated while the programmableconnection elements 304 and 308 are disabled. As a result, there is anelectrical connection between the port A and the port B through theprogrammable connection element 302, the electrical connection 372, theresistor 334, the electrical connection 374 and the programmableconnection element 306. There is, however, no electrical connectionbetween the port C and the port D because the programmable connectionelements 304 and 308 are disabled. In contrast, when the port E islogically high, the signal E_B is logically low and the signal E_P islogically high. The programmable connection elements 302 and 306 aretherefore disabled while the programmable connection elements 304 and308 are activated. As a result, there is no electrical connectionbetween the port A and the port B because the programmable connectionelements 302 and 306 are disabled. There is, however, an electricalconnection between the port C and the port D through the programmableconnection element 304, the electrical connection 372, the resistor 334,the electrical connection 374 and the programmable connection element308.

In FIG. 3, the capacitors 322, 324 and 326 are placed at the same die asthe resistors 332 and 334. The capacitors 322, 324 and 326, however, maybe placed at different levels of hierarchy in a die stack as theresistors 332 and 334. For example, in some embodiments, the capacitors322, 324 and 326 are placed in the interposer 130 in FIG. 2A while theresistors 332 and 334 are placed in the die 110 in FIG. 2A or a PC boardthat the interposer 130 is stacked on. In some other embodiments, atleast one of the capacitors 322, 324 and 326 or the resistors 332 and334 may be placed at a different level of hierarchy in a die stack. Forexample, all of the capacitors and resistors are located in theinterposer 130 except that the resistor 332 is located in the die 110 ora PC board that the interposer 130 is stacked on. The resistors 332 and334 may be formed by metal routing, poly routing, OD routing, externalresistor component, or the like. The capacitors 322, 324 and 326 may beformed by Metal-Insulator-Metal (MIM) capacitors and/orMetal-Oxide-Metal (MOM) capacitors, or the like.

In FIG. 2, the PLL 115 is similar to the PLL 125 for ease ofillustration. The PLL 115, however, may be different from the PLL 125.For example, in some embodiments, the VCO 146 in the PLL 115 is designedto output a 5 GHz clock, while the VCO 166 in the PLL 125 is designed tooutput a 1 GHz clock. In such a situation, the LF 180 is configured andadaptively controlled to provide corresponding bandwidths tocorresponding feedback loops, as described in detail in FIG. 4.

FIG. 4 is a loop filter 400 illustrating another implementation of theLF 180 in FIG. 2, according to another example embodiment. The loopfilter 400 is similar to the loop filter 300 in FIG. 3, except withadditional circuits 462, 464 and 466. The circuit 462 includes capacitor432 and programmable connection element 412 that are serially connectedbetween the electrical connection 372 and the ground. The circuit 462also includes capacitor 434 and programmable connection element 414 thatare serially connected between the electrical connection 372 and theground. The circuit 466 includes capacitor 436 and programmableconnection element 416 that are serially connected between theelectrical connection 374 and the ground. The circuit 466 also includescapacitor 438 and programmable connection element 418 that are seriallyconnected between the electrical connection 374 and the ground. Thecircuit 464 is serially connected between the resistor 334 and theelectrical connection 374, and includes resistors 442 and 444, andprogrammable connection elements 422 and 424. In circuit 464, theresistor 442 that is in parallel with the programmable connectionelement 422 is serially connected with the resistor 444. Resistor 444 isconnected in parallel with the programmable connection element 424. Insome embodiments, the programmable connection elements 412, 414, 422,424, 416, and 418 are implemented using the programmable connectionelement 200 shown in FIG. 2B.

The signal E_B is connected to the corresponding electrical port 26shown in FIG. 2B of programmable connection elements 414, 416 and 424.The signal E_P is connected to the corresponding electrical port 26shown in FIG. 2B of programmable connection elements 412, 418 and 422.When the port E is logically low, the signal E_B is logically high andE_P is logically low. The programmable connection elements 414, 416 and424 are therefore activated while the programmable connection elements412, 418 and 422 are disabled. As a result, the capacitor 434 isconfigured to connect the electrical connection 372 and the ground.Similarly, the capacitor 436 is configured to connect the electricalconnection 374 and the ground. In addition, the resistor 442 isconfigured to connect the resistor 334 and the electrical connection374. In contrast, when the port E is logically high, the signal E_B islogically low and E_P is logically high. The programmable connectionelements 414, 416 and 424 are therefore disabled while the programmableconnection elements 412, 418 and 422 are activated. As a result, thecapacitor 432 is configured to connect the electrical connection 372 andthe ground. Similarly, the capacitor 438 is configured to connect theelectrical connection 374 and the ground. In addition, the resistor 444is configured to connect the resistor 334 and the electrical connection374. In this way, the total effective capacitance of capacitor 322 and326, and the total effective resistance of resistor 334 are configurableto change in order to provide designated bandwidths for correspondingPLL feedback loops.

In FIG. 4, the capacitors 322, 324, 326, 432, 434, 436 and 438 areplaced at the same die as the resistors 332, 334, 442 and 444. Thecapacitors 322, 324, 326, 432, 434, 436 and 438, however, may be placedat different levels of hierarchy in a die stack as the resistors 332,334, 442 and 444. For example, the capacitors 322, 324, 326, 432, 434,436 and 438 are placed at the interposer 130 in FIG. 2A while theresistors 332, 334, 442 and 444 are placed in the die 110 in FIG. 2A ora PC board that the interposer 130 is stacked on. In other embodiments,at least one of the capacitors 322, 324, 326, 432, 434, 436, 438 or theresistors 332, 334, 442 and 444 may be placed at a different level ofhierarchy in a die stack. For example, all of the capacitors andresistors are located in the interposer 130 except that the resistor 332is located in the die 110 or a PC board that the interposer 130 isstacked on. The resistors 332, 334, 442 and 444 may be formed by metalrouting, poly routing, OD routing, external resistor component, or thelike. The capacitors 322, 324, 326, 432, 434, 436 and 438 may be formedby Metal-Insulator-Metal (MIM) capacitors and/or Metal-Oxide-Metal (MOM)capacitors, or the like.

With reference to FIG. 5, die stack 500 illustrates another clockgeneration means of each die in a die stack of FIG. 1, according to anexample embodiment. The die stack 500 includes dies 510 and 520 and aninterposer 530. The dies 510 and 520 include clock generation circuits515 and 525, respectively. The interposer 530 includes a PFD 562, a CP564, a LF 180 and a multiplexer 566. The PFD 562 is similar to the PFD142 or 162 in FIG. 2. The CP 564 is similar to the CP 144 or 164 in FIG.2. The LF 180 may be implemented using the LF300 in FIG. 3 or the LF 400in FIG. 4. The clock generation circuit 515 includes a VCO 146 and a DIV148. A DC voltage outputted from the LF 180 is fed to the VCO 146through an electrical connection 156. The VCO 146 outputs a clock toelectrical connection 150, which is also fed to the multiplexer 666through the DIV 148, and then connected to the PFD 562 through anelectrical connection 572. As a result, the PFD 562, the CP 564, the LF180, the multiplexer 566 combined with clock generation circuit 515 forma PLL feedback loop. For example, PFD 562, CP 564, LF 180, VCO 146, DIV148, and multiplexer 566 form the feedback loop.

Similarly, the clock generation circuit 525 includes a VCO 166 and a DIV168. A DC voltage outputted from the LF 180 is fed to the VCO 166through an electrical connection 176. The VCO 166 outputs a clock toelectrical connection 170, which is also fed to the multiplexer 566through the DIV 168, and then connected to the PFD 562 through theelectrical connection 572. As a result, the PFD 562, the CP564, the LF180, and the multiplexer 566 together with clock generation circuit 525form another PLL feedback loop. For example, PFD 562, CP 564, LF 180,VCO 166, DIV 168, and multiplexer 566 form the feed back loop.

In FIG. 5, the PFD 562, the CP 564, the LF 180 and the multiplexer 566are placed in the interposer 130 for ease of illustration. The PFD 562,the CP 564, the LF 180 or the multiplexer 566, however, may be placed inthe dies 110, 120, or other die stacked on the interposer 130.

With reference to FIG. 6, waveform 600 illustrates the relationship offeedback loop selection signals, according to an example embodiment. Intime period T1, the selection signal on the port E and the signal E_Pare logically low, and the signal E_B is logically high. As a result,the feedback loop that includes the PLL 115 in FIG. 2A or the clockgeneration circuit 515 in FIG. 5 is a closed loop. The clock phase ofthe clock on the electrical connection 150 in FIG. 2A or FIG. 5 islocked with regard to the clock REF_CLK 135 within the correspondingtime period T1. In time period T2, the selection signal on the port Eand the signal E_P are logically high, and the signal E_B is logicallylow. As a result, the feedback loop that includes the PLL 125 in FIG. 2Aor the clock generation circuit 525 in FIG. 5 is a closed loop. Theclock phase of the clock on the electrical connection 170 in FIG. 2A orFIG. 5 is locked to the signal REF_CLK 135 within the corresponding timeperiod T2. Time period T1 is followed by time period T2, which is inturn followed by time period T1. This periodic phase locking for each ofthe feedback loops is performed continuously during functionaloperations of the die stack 100 or 500. In some embodiments, the timeperiod T1 is different from the time period T2. In some otherembodiments, the time period T1 is to the same as the time period T2.

In some embodiments, an integrated circuit die stack is provided. Theintegrated circuit die stack includes a first and a second die connectedto each other, and each of the first and second dies include at leastone PLL. The PLLs in the first and second dies share a common loopfilter to form corresponding feedback loops.

In other embodiments, an integrated circuit die stack is provided. Theintegrated circuit die stack includes a first die, a second die, ashared phase frequency detector, a shared charge pump, and a shared loopfilter. In addition, the first die includes at least one voltagecontrolled oscillator and divider, the second die includes at leastanother voltage controlled oscillator and divider. The first and seconddies are electrically connected to each other. The at least one voltagecontrolled oscillator and divider in the first die combine with theshared phase frequency detector, the shared charge pump, and the sharedloop filter to form a PLL feedback loop. And, the at least anothervoltage controlled oscillator and divider in the second die combineswith the shared phase frequency detector, the shared charge pump, andthe shared loop filter to form another PLL feedback loop.

In some embodiments, an integrated circuit die stack is provided. Theintegrated circuit die stack includes a first die, a second die and ashared loop filter. In addition, the first die includes at least onePLL, and the second die includes at least another PLL. Moreover, theshared loop filter includes a plurality of programmable connectionelements. The first and second dies are electrically connected to eachother. The elements of the at least one PLL in the first die combinewith the shared loop filter to form a PLL feedback loop. And, theelements of the at least another PLL in the second die combine with theshared loop filter to form another PLL feedback loop. The pluralities ofprogrammable connection elements are configured to activate one of thePLL feedback loops at a time.

What is claimed is:
 1. An integrated circuit die stack, comprising: afirst and a second die connected to each other, each of the first andsecond dies comprising at least one phase-locked loop (PLL), whereinPLLs in the first and second dies share a common loop filter to formcorresponding feedback loops.
 2. The integrated circuit die stack ofclaim 1, wherein the loop filter comprises a plurality of programmableconnection elements, and wherein the plurality of programmableconnection elements are configured to activate one of the correspondingfeedback loops at a time.
 3. The integrated circuit die stack of claim1, wherein the loop filter is configured to provide similar bandwidth tothe corresponding feedback loops.
 4. The integrated circuit die stack ofclaim 1, wherein the loop filter is configured to provide configurablebandwidths to the corresponding feedback loops.
 5. The integratedcircuit die stack of claim 1, wherein each PLL in the first and seconddies comprises a phase frequency detector, a charge pump, a voltagecontrolled oscillator and a divider.
 6. The integrated circuit die stackof claim 1, wherein the loop filter comprises a plurality of capacitors,and wherein the pluralities of capacitors are formed byMetal-Insulator-Metal (MIM) capacitors and/or Metal-Oxide-Metal (MOM)capacitors.
 7. The integrated circuit die stack of claim 1, furthercomprising an interposer that the first and second dies are stacked on,and wherein the common loop filter is located in the interposer.
 8. Anintegrated circuit die stack, comprising: a first die comprising atleast one voltage controlled oscillator and divider; a second diecomprising at least another voltage controlled oscillator and divider; ashared phase frequency detector; a shared charge pump; and a shared loopfilter, wherein the first and second dies are electrically connected toeach other; the at least one voltage controlled oscillator and thedivider in the first die combine with the shared phase frequencydetector, the shared charge pump, and the shared loop filter to form aPLL feedback loop; and the at least another voltage controlledoscillator and the divider in the second die combines with the sharedphase frequency detector, the shared charge pump, and the shared loopfilter to form another PLL feedback loop.
 9. The integrated circuit diestack of claim 8, wherein the shared loop filter comprises a pluralityof programmable connection elements, and wherein the plurality ofprogrammable connection elements are configured to activate one of thePLL feedback loops at a time.
 10. The integrated circuit die stack ofclaim 8, wherein the shared loop filter is configured to provide similarbandwidths to the corresponding feedback loops.
 11. The integratedcircuit die stack of claim 8, wherein the shared loop filter isconfigured to provide configurable bandwidths to the correspondingfeedback loops.
 12. The integrated circuit die stack of claim 8, whereinperiodic phase locking for each of the feedback loops is performedcontinuously during functional operations of the integrated circuit diestack.
 13. The integrated circuit die stack of claim 8, wherein theshared loop filter comprises a plurality of capacitors, and wherein thepluralities of capacitors are formed by Metal-Insulator-Metal (MIM)capacitors and/or Metal-Oxide-Metal (MOM) capacitors.
 14. The integratedcircuit die stack of claim 8, further comprising an interposer that thefirst and second dies are stacked on; and wherein the shared phasefrequency detector, the shared charge pump, and the shared loop filterare located in the interposer.
 15. An integrated circuit die stack,comprising: a first die comprises at least one phase-locked loop (PLL);a second die comprises at least another PLL; and a shared loop filterwith a plurality of programmable connection elements, wherein the firstand second dies are electrically connected to each other; elements ofthe at least one PLL in the first die combine with the shared loopfilter to form a PLL feedback loop; elements of the at least one PLL inthe second die combine with the shared loop filter to form another PLLfeedback loop; and the plurality of programmable connection elements areconfigured to activate one of the PLL feedback loops at a time.
 16. Theintegrated circuit die stack of claim 15, wherein shared the loop filteris configured to provide similar bandwidths to the correspondingfeedback loops.
 17. The integrated circuit die stack of claim 15,wherein the shared loop filter is configured to provide configurablebandwidths to the corresponding feedback loops.
 18. The integratedcircuit die stack of claim 15, wherein each of the at least one PLL inthe first and second dies comprises a phase frequency detector, a chargepump, a voltage controlled oscillator and a divider.
 19. The integratedcircuit die stack of claim 15, wherein the shared loop filter comprisesa plurality of capacitors, and wherein the pluralities of capacitors areformed by Metal-Insulator-Metal (MIM) capacitors and/orMetal-Oxide-Metal (MOM) capacitors.
 20. The integrated circuit die stackof claim 15, further comprising an interposer that the first and seconddies are stacked on, wherein the shared loop filter is located in theinterposer.